Fraunhofer Institute for High Frequency Physics and Radar Techniques FHRLive-Event / June 09, 2025 - June 12, 2025
PANNDT 2025
At this year's exhibition of the Pan-American Conference for Nondestructive Testing in Canada, Fraunhofer FHR will present a range of cutting-edge exhibits.
Visit us at PANNDT 2025 in Ontario.
Events
Event details
Program
The technical program of the conference will present the latest developments in the fields of non-destructive testing techniques, tools, and trends. This valuable conference is a must-attend event for professionals in the fields of inspection, quality assurance/quality control, manufacturing, and non-destructive testing.
The conference will be organized by the Canadian Institute for Non-Destructive Evaluation (CINDE).
Location
Niagara Falls, Ontario, Canada
Date
June 09, 2025 - June 12, 2025
SAMMI - Compact imaging millimeter wave sensor
At the PANNDT, Fraunhofer FHR will be presenting the SAMMI® system for non-destructive testing in process control. SAMMI® is a 40 x 40 x 30 centimeter millimeter wave scanner that can be used to examine objects up to 30 x 30 x 5 centimeters in size. Technologically speaking, there is no limit to the size of the device. With SAMMI®, the object to be examined is placed on a belt and transported through the device. The monostatic transmitting and receiving antenna rotates above the belt. Possible foreign bodies in the examined object can be seen in real time on the display of the device.
µRADAS (µController Radar-based Surface Reconstruction and Data Acquisition System)
At the PANNDT, Fraunhofer FHR will be presenting the µRADAS system for non-destructive testing in process control. µRADAS is a resource-efficient scanner for detailed scanning of the surface of an object using a tomographic approach. This allows the surface contour of samples to be mapped in two dimensions. A three-dimensional visualization can also be performed to make the inner structures of electrically non-conductive materials visible.